Wielandts UPMT will present its patent pending Dynamic Part Indexing (DPI) system at the SPIE Optifab 2015 trade show in Rochester, New York on the booth of Moore Nanotech (have a look at their September newsletter). The show will take place between October 13th and 15th (see our October newsletter, and flyers under the Downloads tab).
In parallel, a scientific paper will be presented at the conference on Wednesday October 14th 2015 between 1:40 PM and 3:00 PM. The article is titled: “Novel method for fabrication of monolithic multi-cavity molds and wafer optics”.
