Wielandts UPMT at SPIE Optifab 2015

SPIE Optifab logo

Wielandts UPMT will present its patent pending Dynamic Part Indexing (DPI) system at the SPIE Optifab 2015 trade show in Rochester, New York on the booth of Moore Nanotech (have a look at their September newsletter). The show will take place between October 13th and 15th (see our October newsletter, and flyers under the Downloads tab).

In parallel, a scientific paper will be presented at the conference on Wednesday October 14th 2015 between 1:40 PM and 3:00 PM. The article is titled: “Novel method for fabrication of monolithic multi-cavity molds and wafer optics”.

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