UPMT’s DPI® and CLAP™ proprietary technologies further push the limitations of micro optics mastering by achieving submicron position accuracy over the complete area of a large master, introducing new solutions for small series to large volume replication.
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Measurements results
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The measurement results show that the CLAP™ system achieves sub-micron position accuracy (XY) over all the lenses of all the machined lens arrays, with a typical average position error of 0.3µm (!).
The position of each MLA with respect to each other was also measured. As shown in the table here under, the achieved position error from MLA to MLA is below 1µm.
The errors observed on the sag of the lenses are also directly linked to unstable environmental conditions affecting the entire machining process. As shown on the diagram, while using the CLAP™ technology the residual errors measured are substantially lowered with a maximum sag variation of +/- 0.5µm. In conclusion, despite the duration of the machining process and the large size of the master, the measurements performed on this demonstrator show that the DPI® technology coupled with the new CLAP™ alignment system delivers outstanding XYZ accuracy. While maintaining the unrivaled form and roughness quality achieved by diamond turning, these new developments allow to machine lens array masters or fully populated masters with incomparable lens to lens accuracy, for example allowing more products to be replicated simultaneously while avoiding (or even compensating for) errors introduced by other consecutive processes. |